Product Details: Microanalysis of Solids
| Author: | D. B. Holt, B. G. Yacobi, B. Ed. Yacobi |
| Editor: | L.L. Kazmerski, Lawrence L. Kazmerski |
| Edited by: | L. L. Kazmerski |
| Format: | Hardcover: Revised: 480 pages. |
| Publisher: | Plenum Pub Corp (02/01/1994) |
| ISBN: | 030644433X |
| ISBN13: | 9780306444333 |
| Reading Level: |
Publisher Notes: Microanalysis of Solids
1 An Introduction to Microanalysis of Solids
by B. G. Yacobi, D. B. Holt2 Scanning Electron Microscopy
by B. G. Yacobi, D. B. Holt3 Transmission Electron Microscopy
by A. J. Garratt-Reed4 Auger Electron Spectroscopy
by L. L. Kazmerski5 Secondary Ion Mass Spectrometry
by S. E. Asher6 Applications of Megaelectron-Volt Ion Beams in Materials Analysis
by P. Revesz, J. Li7 Confocal Microscopy
by T. Wilson8 X-ray Microscopy
by A. G. Michette, A. W. Potts9 X-ray Photoemission Spectroscopy
by A. J. Nelson10 Laser Ionization Mass Spectrometry
by R. W. Odom, F. Radicati di Brozolo11 Microellipsometry
by R. F. Cohn12 Scanning Acoustic Microscopy
by P. Mutti, G. A. D. Briggs13 Field Emission, Field Ion Microscopy, and the Atom Probe
by J. J. Hren, J. Liu14 Scanning Probe Microscopy
by D. A. Grigg, P. E. RussellIndex
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